Hae LUTPubista
Aineistot 1-2 / 2
Atomic Force Microscopy of electrical, mechanical and piezo properties of nanowires
(Lappeenranta University of Technology, 2018-12-07)
Careful methodology of Atomic Force Microscopy (AFM) regimes was developed for advanced examination of electrical transport, mechanical strength and electro-mechanical (piezoelectric) features of as-grown III-V semiconductor ...
Piezo force microscopy and peakforce tuna measurements of III-V semiconductor nanowires
(2016)
GaN, InP and GaAs nanowires were investigated for piezoelectric response. Nanowires and structures based on them can find wide applications in areas purposes such as nanogenarators, nanodrives, Solar cells and other ...