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Atomic Force Microscopy of electrical, mechanical and piezo properties of nanowires
(Lappeenranta University of Technology, 2018-12-07)
Careful methodology of Atomic Force Microscopy (AFM) regimes was developed for advanced examination of electrical transport, mechanical strength and electro-mechanical (piezoelectric) features of as-grown III-V semiconductor ...
Microscopy investigation of the surface of some modern magnetic materials
(Lappeenranta-Lahti University of Technology LUT, 2021-02-12)
This thesis is based on experimental work with standard commercial measuring stations. The main idea was to recognise possibilities of two surface analysis methods for different types of magnetic materials. Magnetic particles ...