Selaus tekijän mukaan kokoelmassa "Jormanainen, Joni"Tieteelliset julkaisut
-
Localization of dielectric breakdown defects in multilayer ceramic capacitors using 3D X-ray imaging
Ingman, Jonny; Jormanainen, Joni; Vulli, Aleksi; Ingman, Jimmy; Maula, Kari; Kärkkäinen, Tommi; Silventoinen, Pertti (Elsevier, 2018)In this article, a non-destructive method using 3D X-ray imaging to find dielectric breakdowndefects in multilayer ceramic capacitors (MLCCs) aged by high temperature and high voltage in an accelerated test is presented. ...