Observations of Acoustic Emission in Power Semiconductors
Kärkkäinen, Tommi (2015-12-19)
Väitöskirja
Kärkkäinen, Tommi
19.12.2015
Lappeenranta University of Technology
Acta Universitatis Lappeenrantaensis
Julkaisun pysyvä osoite on
https://urn.fi/URN:ISBN:978-952-265-912-5
https://urn.fi/URN:ISBN:978-952-265-912-5
Tiivistelmä
Industrial, electrical power generation, and transportation systems, to name but a few, rely
heavily on power electronics to control and convert electrical power. Each of these systems,
when encountering an unexpected failure, can cause significant financial losses, or even an
emergency. A condition monitoring system would help to alleviate these concerns, but for the
time being, there is no generally accepted and widely adopted method for power electronics.
Acoustic emission is used as a failure precursor in many applications, but it has not been
studied in power electronics so far.
In this doctoral dissertation, observations of acoustic emission in power semiconductor components
are presented. The acoustic emissions are caused by the switching operation and
failure of power transistors. Three types of acoustic emission are observed. Furthermore, aspects
related to the measurement and detection of acoustic phenomena are discussed. These
include sensor performance and mechanical construction of experimental setups.
The results presented in this dissertation are the outset of a research program where it will be
determined whether an acoustic-emission-based condition monitoring method can be developed.
heavily on power electronics to control and convert electrical power. Each of these systems,
when encountering an unexpected failure, can cause significant financial losses, or even an
emergency. A condition monitoring system would help to alleviate these concerns, but for the
time being, there is no generally accepted and widely adopted method for power electronics.
Acoustic emission is used as a failure precursor in many applications, but it has not been
studied in power electronics so far.
In this doctoral dissertation, observations of acoustic emission in power semiconductor components
are presented. The acoustic emissions are caused by the switching operation and
failure of power transistors. Three types of acoustic emission are observed. Furthermore, aspects
related to the measurement and detection of acoustic phenomena are discussed. These
include sensor performance and mechanical construction of experimental setups.
The results presented in this dissertation are the outset of a research program where it will be
determined whether an acoustic-emission-based condition monitoring method can be developed.
Kokoelmat
- Väitöskirjat [1075]