Piezo force microscopy and peakforce tuna measurements of III-V semiconductor nanowires
Fominykh, Anatoly (2016)
Diplomityö
2016
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi-fe2016052612906
https://urn.fi/URN:NBN:fi-fe2016052612906
Tiivistelmä
GaN, InP and GaAs nanowires were investigated for piezoelectric response. Nanowires and structures based on them can find wide applications in areas purposes such as nanogenarators, nanodrives, Solar cells and other perspective areas.
Experemental measurements were carried out on AFM Bruker multimode 8 and data was handled with Nanoscope software. AFM techniques permitted not only to visualize the surface topography, but also to show distribution of piezoresponse and allowed to calculate its properties. The calculated values are in the same range as published by other authors.
Experemental measurements were carried out on AFM Bruker multimode 8 and data was handled with Nanoscope software. AFM techniques permitted not only to visualize the surface topography, but also to show distribution of piezoresponse and allowed to calculate its properties. The calculated values are in the same range as published by other authors.