Selaus avainsanan mukaan kokoelmassa "Young’s modulus"Väitöskirjat

    • Atomic Force Microscopy of electrical, mechanical and piezo properties of nanowires 

      Geydt, Pavel
      Acta Universitatis Lappeenrantaensis (Lappeenranta University of Technology, 07.12.2018)
      Careful methodology of Atomic Force Microscopy (AFM) regimes was developed for advanced examination of electrical transport, mechanical strength and electro-mechanical (piezoelectric) features of as-grown III-V semiconductor ...