Microscopy investigation of the surface of some modern magnetic materials

Abstract

This thesis is based on experimental work with standard commercial measuring stations. The main idea was to recognise possibilities of two surface analysis methods for different types of magnetic materials. Magnetic particles on amorphous wafer or deposited on/in porous Silicon, and magnetic thin films and crystals were the objects for the study.

The applicability of the microscopy methods for surface investigation of the versatile magnetic materials with different properties and structures is important to understand. Moreover, it was essential to outline the principal limitations and accuracy of the chosen research approaches. The used microscopy techniques are nowadays among the most widespread and popular methods for surface investigation.

The experimental work was carried out on the standard commercial Scanning Electron and Atomic Force microscopes. The research methods justified their applicability to the surface investigation. The chosen methods permitted to reveal significant features and to confirm data obtained by means of other research techniques.

Scanning electron microscope confirmed the porosity of the specimen, defined the pores size, and helped to formulate a hypothesis of the structure formation. Scanning electron microscope was equipped with the Energy-Dispersive spectroscopy which allowed to identify the elemental components of the studied samples. Atomic force microscope showed the surface structure. Magnetic force microscopy revealed the magnetic domains in samples and the temperature influence on the structure of domains structure.